Short-Wave Infrared (SWIR) constitutes a specifically engineered optical lens devised to capture short-wave infrared light that is not directly perceivable by the human eye. This band is customarily designated as light with wavelengths spanning from 0.9 to 1.7 microns. The operational principle of the short-wave infrared lens hinges on the transmission properties of the material for a specific wavelength of light, and with the assistance of specialized optical materials and coating technology, the lens can proficiently conduct short-wave infrared light while suppressing visible light and other undesirable wavelengths.
Its principal characteristics comprise:
1. High transmittance and spectral selectivity: SWIR lenses employ specialized optical materials and coating technology to attain high transmittance within the short-wave infrared band (0.9 to 1.7 microns) and possess spectral selectivity, facilitating the identification and conduction of specific wavelengths of infrared light and the inhibition of other wavelengths of light.
2. Chemical corrosion resistance and thermal stability: The material and coating of the lens demonstrate outstanding chemical and thermal stability and can sustain optical performance under extreme temperature fluctuations and diverse environmental circumstances.
3. High resolution and low distortion: SWIR lenses manifest high resolution, low distortion, and rapid response optical attributes, fulfilling the requirements of high-definition imaging.
Shortwave infrared lenses are extensively utilized in the domain of industrial inspection. For example, in the semiconductor manufacturing process, SWIR lenses can detect flaws inside silicon wafers that are arduous to detect under visible light. Shortwave infrared imaging technology can augment the accuracy and efficiency of wafer inspection, thereby reducing manufacturing costs and enhancing product quality.
Short-wave infrared lenses play a vital role in semiconductor wafer inspection. Since shortwave infrared light can permeate silicon, this attribute empowers short-wave infrared lenses to detect defects within silicon wafers. For instance, the wafer might have fissures due to residual stress during the production process, and these fissures, if undetected, will directly influence the yield and manufacturing cost of the final completed IC chip. By leveraging short-wave infrared lenses, such defects can be effectively discerned, thereby promoting production efficiency and product quality.
In practical applications, shortwave infrared lenses can furnish high-contrast images, making even minute defects conspicuously visible. The application of this detection technology not only enhances the accuracy of detection but also reduces the cost and time of manual detection. According to the market research report, the demand for short-wave infrared lenses in the semiconductor detection market is ascending year by year and is expected to maintain a stable growth trajectory in the forthcoming few years.
Post time: Nov-18-2024